Z. Zhang, X. Z. Lai, C. D. Lu, S. Du, W. K. Yu, M. Wu. Statistics pattern cointegration analysis-based bit bounce detection for drilling process. IEEE Transactions on Industrial Electronics, 2024, 71 (2): 2039-2048.
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Z. Zhang, X. Z. Lai, C. D. Lu, S. Du, W. K. Yu, M. Wu. Statistics pattern cointegration analysis-based bit bounce detection for drilling process. IEEE Transactions on Industrial Electronics, 2024, 71 (2): 2039-2048.
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